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Positron Annihilation Spectroscopy Study of Interfacial Defects Formed by Dissolution of Aluminum in Aqueous Sodium Hydroxide Microscopy

著者名:
掲載資料名:
Oxide Films : proceedings of the International Symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2000-4
発行年:
2000
開始ページ:
167
終了ページ:
178
総ページ数:
12
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772693 [1566772699]
言語:
英語
請求記号:
E23400/2000-4
資料種別:
国際会議録

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