Parameter Extraction for Buried Oxide Traps from High-Temperature Kink Effect of Back- Channel SOI TM n-MOSFET
- 著者名:
- Nazarov, A N ( (Institute of Semiconductor Physics, NASU) )
- Barchuk, I P ( (Institute of Semiconductor Physics, NASU) )
- Lysenko, V S L ( (Institute of Semiconductor Physics, NASU) )
- Colinge, J P ( (University of California, Davis) )
- 掲載資料名:
- Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 99-3
- 発行年:
- 1999
- 開始ページ:
- 299
- 終了ページ:
- 304
- 総ページ数:
- 6
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772259 [1566772257]
- 言語:
- 英語
- 請求記号:
- E23400/99-3
- 資料種別:
- 国際会議録
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