A Steady-state Ramp Method for Carrier Lifetime Measurement in the SOI MOSFET

A Steady-state Ramp Method for Carrier Lifetime Measurement in the SOI MOSFET

著者名:

Cheng, Z-Y ( (National University of Singapore) )
Ling, C H ( (National University of Singapore) )

掲載資料名:

Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

99-3

発行年:

1999

開始ページ:

207

終了ページ:

212

総ページ数:

6

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566772259 [1566772257]

言語:

英語

請求記号:

E23400/99-3

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013933
シリーズID:	PA00000028
会議名:	International Symposium on Silicon-on-Insulator Technology and Devices ; Meeting of the Electrochemical Society
回次:	9th ; 195th
会議開催地:	Seattle, WA, USA
会議開催年:	1999.05.02-1999.05.07

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1 国際会議録 Measurement of generation lifetime in partially depleted SOI MOSFETs Shin, H C, Racanelli, M, Huang, W M, Ford, J, Foersiner, J, Shin, H, Wetteroth, T, Hong, S Q, Wilson, S R, Schroder, D … Electrochemical Society	7 国際会議録 SOI thermal resistance and its application to thermal modeling of SOI MOSFETs Cheng, M.-C., Yu, F. Electrochemical Society
2 国際会議録 Hot-carrier-induced degradation and lifetime prediction in off-state operation of deep submicron SOI n-MOSFETs Renn, S.H., Pelloie, J.L., Balestra, F. Electrochemical Society	8 国際会議録 Temperature and magnetic field dependence of the carrier mobility in SOI wafers by the pseudo-MOSFET method Rossel, C., Halley, D., Cristoloveanu, S. Electrochemical Society
3 国際会議録 Gate-to Drain Capacitance as a Monitor for Hot-Carrier Degradation in Sbmictometer MOSFETs Ling, C.H. Electrochemical Society	9 国際会議録 Measurements of Low Field Mobility in Ultre-Thin SOI n- and p-Mosfets Mastrapasqua, M., Esseni, D., Celler, G.K., Baumann, F.H., Fiegna, C., Selmi, L., Sangiorgi, E. Electrochemical Society
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5 国際会議録 Steady-state and Time-resolved Photoconductivity Measurements of Minority Carrier Lifetime in ZnTe Bose,D.N., Johnston,S., Ahrenkiel,R.K., Bhunia,S. SPIE - The International Society for Optical Engineering	11 国際会議録 Opposite-channel-based hot-carrier injection in SOI MOSFET's Zaleski, A., Ioannou, D.E., Campisi, G.J., Hughes, H.L. Electrochemical Society
6 国際会議録 Observation of Bulk-Trap Induced Generation-Recombination Noise in the Fully Depleted SOI MOSFET Lun, Z., Ang, D.S., Ling, C.H. Electrochemical Society	12 国際会議録 Modeling and measurements of high temperature off-state currents in SOI MOSFETs Rudenko, T., Rudenko, A., Kilchitskaya, V. Electrochemical Society

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