Thin Nitride Barrier Self-Aligned Contact (TNBSAC) Oxide Etching in a High Density Inductively Coupled Plasma Using C4F8/CH3F/Ar Chemistry
- 著者名:
Kim, J-H. Ryu, J-O. Kim, J-S. Lee, B-C. Kim, J-W. Seol, Y-S. - 掲載資料名:
- Proceedings of the twelfth International Symposium on Plasma Processing
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 98-4
- 発行年:
- 1998
- 開始ページ:
- 137
- 終了ページ:
- 145
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771986 [1566771986]
- 言語:
- 英語
- 請求記号:
- E23400/98-4
- 資料種別:
- 国際会議録
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