Characterization methods for semiconductor materials and device processing
- 著者名:
Oppoizer, H. Budde, K. Cerva, H. Criegern, R.v. Jahnel, F. Lemme, R. - 掲載資料名:
- Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 97-22
- 発行年:
- 1997
- 開始ページ:
- 351
- 終了ページ:
- 362
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771757 [1566771757]
- 言語:
- 英語
- 請求記号:
- E23400/97-22
- 資料種別:
- 国際会議録
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