Noise as a Spectroscopic Tool for Semiconductor Characterization
- 著者名:
- 掲載資料名:
- Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 97-12
- 発行年:
- 1997
- 開始ページ:
- 324
- 終了ページ:
- 341
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771399 [1566771390]
- 言語:
- 英語
- 請求記号:
- E23400/97-12
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
2
国際会議録
Reports 1/f type low frequency noise and suggests noise measurement as a tool for trap study.
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
SPIE - The International Society of Optical Engineering | |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |