Lattice Strain and Defects in Epitaxial Silicon Wafers
- 著者名:
Kirscht, F. Snegirev, B. Zaumseil, P. Kissinger, G. Takashima, K. Wildes, P. Hennessy, J. - 掲載資料名:
- Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 97-12
- 発行年:
- 1997
- 開始ページ:
- 60
- 終了ページ:
- 67
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771399 [1566771390]
- 言語:
- 英語
- 請求記号:
- E23400/97-12
- 資料種別:
- 国際会議録
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