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Freeze-out Effects on the Characteristics of Deep Submicron Si MOSFETs in the 77 to 300 K Range

著者名:
Croon, J.
Biesemans, S.
Kubicek, S.
Simoen, E.
De Meyer, K.
Claeys, C.
さらに 1 件
掲載資料名:
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
97-2
発行年:
1997
開始ページ:
187
終了ページ:
198
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771290 [1566771293]
言語:
英語
請求記号:
E23400/970511
資料種別:
国際会議録

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