A Structural and Chemical Investigation of WSi Ohmic Contacts to n+-GaN
- 著者名:
Cole, M.W. Eckart, D.W Han, W.Y. Monahan, T. Ren, F. Pearton, S.J. - 掲載資料名:
- Proceedings of the Symposium on High Speed III-V Electronics for Wireless Applications and the twenty-fifth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXV)
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 96-15
- 発行年:
- 1996
- 開始ページ:
- 271
- 終了ページ:
- 277
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771658 [156677165X]
- 言語:
- 英語
- 請求記号:
- E23400/963435
- 資料種別:
- 国際会議録
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4
国際会議録
Damage Investigation of GaAs and InGaP Dry Etched with an Electron Cyclotron Resonance Source
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Materials Research Society |
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