Monitoring of Neutron Transmutation Doped Silicon Recombination Properties by Microwave Absorption Transient Techniques
- 著者名:
Gaubas, E. Vanhellemont, J. Simoen, E. Claeys, C. Clauws, P. Kraner, H.W. Vilkelis, G. - 掲載資料名:
- Proceedings of the Fourth International Symposium on High Purity Silicon
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 96-13
- 発行年:
- 1996
- 開始ページ:
- 439
- 終了ページ:
- 449
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771566 [1566771560]
- 言語:
- 英語
- 請求記号:
- E23400/963433
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society | |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society, SPIE-The International Society for Optical Engineering | |
Materials Research Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |
MRS - Materials Research Society |