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Characterization of interfaces in silicon-on-insulator structure

著者名:
Kang, S.G.
Ryoo, K.
Kim, H.R.
Seo, G.
Lee, S.H.
Kim, D.S.
Hong, P.Y
さらに 2 件
掲載資料名:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-30
発行年:
1995
開始ページ:
203
終了ページ:
216
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771221 [1566771226]
言語:
英語
請求記号:
E23400/961027
資料種別:
国際会議録

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