Blank Cover Image

Novel method for the investigation of lateral resistivity variations in power devices with high spatial resolution

著者名:
掲載資料名:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-30
発行年:
1995
開始ページ:
109
終了ページ:
120
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771221 [1566771226]
言語:
英語
請求記号:
E23400/961027
資料種別:
国際会議録

類似資料:

Schulze,H.-J.

SPIE - The International Society for Optical Engineering

Schulze, H-J., Kolbesen, B. O.

MRS - Materials Research Society

E. Schulze

Society of Photo-optical Instrumentation Engineers

Niedernostheide, F.-J., Schulze, H.-J., Kellner-Werdehausen, U., Frohnmeyer, A., Wachutka, G.

Electrochemical Society

Schulze,H.-J., Frohnmeyer,A., Niedernostheide,F.-J., Hille,F., Tutto,P., Pavelka,T., Wachutka,G.

Electrochemical Society, SPIE-The International Society for Optical Engineering

Barbour, J.C., Batson, P.E., Mayer, J.W.

Materials Research Society

F. Hille, F.-J. Niedernostheide, H.-J. Schulze

Electrochemical Society

Riemann, H., Luedge, A., Hallmann, B., Turschner, T.

Electrochemical Society

Schulze,H.-J., Deboy,G.

SPIE-The International Society for Optical Engineering

Luedge, A., Riemann, H., Hallmann, B., Wawra, H., Jensen, L., Larsen, T. L., Nielsen, A.

Electrochemical Society

Riemann, H., Luedge, A., Boettcher, K., Rost, H-J., Hallmann, B., Schroeder, W., Hensel, W., Schleusener, B.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12