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New surface photovoltage (SPV) method for high precision measurement of the minority carrier diffusion length and surface recombination velocity in silicon wafers

著者名:
Faifer, V.
Edelman, P.
Kontkiewicz, A.
Lagowski, J.
Hoff, A.
Dyukov, V.
Pravdivtsev, A.
Kornienko, I.
さらに 3 件
掲載資料名:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-30
発行年:
1995
開始ページ:
73
終了ページ:
82
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771221 [1566771226]
言語:
英語
請求記号:
E23400/961027
資料種別:
国際会議録

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