Fabrication and Characterization of Low-Noise Cryogenic Si JFETs

Fabrication and Characterization of Low-Noise Cryogenic Si JFETs

著者名:

Goldberg, R.T.

掲載資料名:

Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

95-9

発行年:

1995

開始ページ:

428

終了ページ:

440

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771030 [156677103X]

言語:

英語

請求記号:

E23400/952069

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013816
シリーズID:	PA00000028
会議名:	Symposium on Low Temperature Electronics and High Temperature Superconductivity ; Meeting of the Electrochemical Society
回次:	3rd ; 187th
会議開催地:	Reno, NV, USA
会議開催年:	1995.05.21-1995.05.26

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