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Theoretical and Experimental Study of the Front and Back Interface Trap Density in Accumulation-Mode SOI MOSFETs

著者名:
掲載資料名:
Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
95-9
発行年:
1995
開始ページ:
271
終了ページ:
277
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771030 [156677103X]
言語:
英語
請求記号:
E23400/952069
資料種別:
国際会議録

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