Temperature Dependence of Gate-Induced-Drain-Leakage (GIDL) Current in Thin-Film SOl MOSFETs
- 著者名:
- 掲載資料名:
- Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 95-9
- 発行年:
- 1995
- 開始ページ:
- 260
- 終了ページ:
- 270
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771030 [156677103X]
- 言語:
- 英語
- 請求記号:
- E23400/952069
- 資料種別:
- 国際会議録
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Analysis and modeling of self-heating effects in thin-film SOI MOSFET's as a function of temperature
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