Substrate Current Characteristics of Partially Depleted SOI n-MOSFETs from Room Temperature down to Liquid Helium Temperatures

Substrate Current Characteristics of Partially Depleted SOI n-MOSFETs from Room Temperature down to Liquid Helium Temperatures

著者名:

掲載資料名:

Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

95-9

発行年:

1995

開始ページ:

251

終了ページ:

259

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771030 [156677103X]

言語:

英語

請求記号:

E23400/952069

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013816
シリーズID:	PA00000028
会議名:	Symposium on Low Temperature Electronics and High Temperature Superconductivity ; Meeting of the Electrochemical Society
回次:	3rd ; 187th
会議開催地:	Reno, NV, USA
会議開催年:	1995.05.21-1995.05.26

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1 国際会議録 Back-gate induced noise overshoot in partially-depleted SOI MOSFETs Lukyanchikova, N., Garbar, N., Smolanka, A., Simoen, E., Claeys, C. Kluwer Academic Publishers	7 国際会議録 A Study on the Self-Heating Effect in Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures Pavanello, M.A., Martino, J.A., Simoen, E., Mercha, A., Claeys, C., Dc Meyer, K. Electrochemical Society
2 国際会議録 Evaluation of the Channel Engineering Impact on the Analog Performance of Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures Pavanello, M. A., Martino, J. A., Simoen, E., Claeys, C. Electrochemical Society	8 国際会議録 Radiation characteristics of short p-channel MOSFETs on SOI substrates Evtukh, A., Kizjak, A., Litovchenko, V., Claeys, C., Simoen, E. Kluwer Academic Publishers
3 国際会議録 Comparison between Bulk and Floating Body Partially Depleted SOI NMOSFETs for High Frequency Analog Applications Operating from 300 K down to 95 K Pavanello, M. A., Martino, J. A., Simoen, E., Claeys, C. Electrochemical Society	9 国際会議録 Temperature and Oxide Thickness Influence on the Generation Lifetime Determination in Partially Depleted SOI NMOSFETs Galeti, M., Martino, J. A., Simoen, E., Claeys, C. Electrochemical Society
4 国際会議録 HALO Effects on 0.13 μm Floating-Body Partially Depleted SOI n-MOSFETs iII Low Temperature Operation J. A. Martino, M. A. Pavanello, E. Simoen, C. Claeys Electrochemical Society	10 国際会議録 Influence of the Drain Bias and Gate Length of Partially Depleted SOI MOSFETs on the ZTC Biasing Point L.M. Camillo, J.A. Martino, E. Simoen, C. Claeys Electrochemical Society
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6 国際会議録 Temperature Influence on the Generation Lifetime Determination Based on Drain Current Transients in Partially Depleted SOI nMOSFETs Martino, J.A., Rafi, J.M., Mercha, A., Simoen, E., Claeys, C. Electrochemical Society	12 国際会議録 Hot-Carrier Degradation of p- and n-Type Si MOSTs Stressed at Liquid Helium Temperature E. Simoen, C. Claeys Electrochemical Society

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