Analysis of Process-Induced Stresses in Lateral Trench Isolation Structures for High Voltage Devices in Bonded SOI Wafers
- 著者名:
Baumgart, H. Letavic, T.J. Wolf, I.De. Tsou, L. Maes, H.E. Egloff, R. - 掲載資料名:
- Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 95-7
- 発行年:
- 1995
- 開始ページ:
- 440
- 終了ページ:
- 454
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771016 [1566771013]
- 言語:
- 英語
- 請求記号:
- E23400/952067
- 資料種別:
- 国際会議録
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