Recent Advances in Fully-Scanned Active Matrix Displays Using Silicon-on-Insulator Technology | 東京工業大学附属図書館文献データベース

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Recent Advances in Fully-Scanned Active Matrix Displays Using Silicon-on-Insulator Technology

著者名:

Batty, D-P. VuM.

さらに 12 件

掲載資料名:

Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

95-7

発行年:

1995

開始ページ:

426

終了ページ:

433

総ページ数:

8

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771016 [1566771013]

言語:

英語

請求記号:

E23400/952067

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013814
シリーズID:	PA00000028
会議名:	International Symposium on Semiconductor Wafer Bonding
回次:	3rd
会議開催地:	Reno, Nevada, USA
会議開催年:	1995.00.00

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