Deep trench isolation in bonded wafer SOI ICs using high density ICP etcher
- 著者名:
Cowen, C S Craven, D R Goodwin, C A Hsieh, C-M Jones, G T Pandhunisoporn, T - 掲載資料名:
- Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 96-3
- 発行年:
- 1995
- 開始ページ:
- 364
- 終了ページ:
- 374
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771535 [1566771536]
- 言語:
- 英語
- 請求記号:
- E23400/962142
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
6
国際会議録
Ultra-High-Speed and Low-Power SOI CMOS Technology with Body-Tied Hybrid Trench Isolation Structure
Electrochemical Society |
Electrochemical Society |