Nanocluster-rich silicon dioxide layers: electroluminescence and charge trapping

Nanocluster-rich silicon dioxide layers: electroluminescence and charge trapping

著者名:

Gebel, T. ( Nanoparc GmbH (Germany) )
Rebohle, L. ( Nanoparc GmbH (Germany) )
Yankov, R.A. ( Nanoparc GmbH (Germany) )
Nazarov, A.N. ( Institute of Semiconductor Physics (Ukraine) )
Skorupa, W. ( Nanoparc GmbH (Germany) and Forschungszentrum Rossendorf e.V. (Germany) )

掲載資料名:

Microwave and Optical Technology 2003

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5445

発行年:

2004

開始ページ:

284

終了ページ:

289

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453686 [0819453684]

言語:

英語

請求記号:

P63600/5445

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013797
シリーズID:	PA00000029
会議名:	International Symposium on Microwave and Optical Technology - ISMOT
回次:	2003 : 9th
会議開催地:	Ostrava, Czech Republic
会議開催年:	2003.08.11-2003.08.15

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