Study on the electromagnetic scattering interaction between a conducting plate and 1D random rough surface
- 著者名:
- Wang, Y. ( Xidian Univ. (China) )
- Guo, L.-X. ( Xidian Univ. (China) )
- 掲載資料名:
- Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5431
- 発行年:
- 2004
- 開始ページ:
- 300
- 終了ページ:
- 307
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453549 [0819453544]
- 言語:
- 英語
- 請求記号:
- P63600/5431
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
国際会議録
Study on the Relationship between Surface Roughness and Texture Features of Engineering Ceramics
Trans Tech Publications |
SPIE - The International Society of Optical Engineering |
Elsevier |