Plate damage identification using wave propagation and impedance methods
- 著者名:
- Wait, J.R. ( Los Alamos National Lab. (USA) )
- Park, G. ( Los Alamos National Lab. (USA) )
- Sohn, H. ( Los Alamos National Lab. (USA) )
- Farrar, C.R. ( Los Alamos National Lab. (USA) )
- 掲載資料名:
- Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5394
- 発行年:
- 2004
- 開始ページ:
- 53
- 終了ページ:
- 65
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453112 [0819453110]
- 言語:
- 英語
- 請求記号:
- P63600/5394
- 資料種別:
- 国際会議録
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6
テクニカルペーパー
Application of Frequency Domain Arx Models and Extreme Value Statistics to Impedance-Based Damage Detection.
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