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High-resolution nondestructive evaluation at the Center for Materials Diagnosis

著者名:
Meyendorf, N. ( Univ. of Dayton Research Institute (USA) )
Sathish, S. ( Univ. of Dayton Research Institute (USA) )
Druffner, C.J. ( Univ. of Dayton Research Institute (USA) )
Blackshire, J.L. ( Univ. of Dayton Research Institute (USA) and Univ. of Dayton (USA) )
Hoffmann, J.P. ( Univ. of Dayton Research Institute (USA) and S&K Technologies Inc. (USA) )
Zhan, Q. ( Univ. of Dayton Research Institute (USA) )
Andrews, R.J. ( Univ. of Dayton Research Institute (USA) )
さらに 2 件
掲載資料名:
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5392
発行年:
2004
開始ページ:
256
終了ページ:
265
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453099 [0819453099]
言語:
英語
請求記号:
P63600/5392
資料種別:
国際会議録

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