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Positron annihilation spectroscopy to study nanoprecipitations in aluminum alloys

著者名:
  • Meyendorf, N. ( Univ. of Dayton Research Institute (USA) )
  • Dlubek, G. ( Institute for Innovation Technologies GmbH (Germany) )
  • Surkov, A. ( Fraunhofer-Institut fur Zerstuerungsfreie Pruefverfahren (Germany) )
掲載資料名:
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5392
発行年:
2004
開始ページ:
54
終了ページ:
62
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453099 [0819453099]
言語:
英語
請求記号:
P63600/5392
資料種別:
国際会議録

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