Evaluation of interactive forces between alkaline earth metal fluoride particles and single crystal substrate using atomic force microscopy

Evaluation of interactive forces between alkaline earth metal fluoride particles and single crystal substrate using atomic force microscopy

著者名:

Tsai, Y.-Y. ( Univ. of Dayton Research Institute (USA) )
Nalladega, V. ( Univ. of Dayton Research Institute (USA) )
Sathish, S. ( Univ. of Dayton Research Institute (USA) )
Stanford, M.K. ( NASA Glenn Research Ctr. (USA) )

掲載資料名:

Testing, Reliability, and Application of Micro- and Nano-Material Systems II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5392

発行年:

2004

開始ページ:

36

終了ページ:

42

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453099 [0819453099]

言語:

英語

請求記号:

P63600/5392

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013744
シリーズID:	PA00000029
会議名:	Smart Structures : Testing, Reliability, and Application of Micro-and Nano-Material Systems
回次:	2004 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2004.03.15-2004.03.17

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