157-nm photoresist process optimization for a full-field scanner
- 著者名:
Light, S. ( IMEC (Belgium) and IMEC (Belgium) ) Stepanenko, N. ( IMEC (Belgium) and IMEC vzw (Belgium) ) Gronheid, R. ( IMEC (Belgium) ) Van Roey, F. ( IMEC (Belgium) ) Van den Heuvel, D. ( IMEC (Belgium) ) Goethals, A.-M. ( IMEC (Belgium) ) - 掲載資料名:
- Optical Microlithography XVII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5377
- 発行年:
- 2004
- 開始ページ:
- 1658
- 終了ページ:
- 1668
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452900 [0819452904]
- 言語:
- 英語
- 請求記号:
- P63600/5377.3
- 資料種別:
- 国際会議録
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