Blank Cover Image

Adaptive thresholding image series from fluorescence confocal scanning laser microscope using orientation intensity profiles

著者名:
  • Feng, J. ( City Univ. of Hong Kong (Hong Kong China) )
  • Ip, H.H. ( City Univ. of Hong Kong (Hong Kong China) )
  • Cheng, S.H. ( City Univ. of Hong Kong (Hong Kong China) )
掲載資料名:
Medical Imaging 2004: Image Processing
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5370
発行年:
2004
開始ページ:
1570
終了ページ:
1577
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452832 [0819452831]
言語:
英語
請求記号:
P63600/5370.3
資料種別:
国際会議録

類似資料:

L. Ou, H. Zhuang, R. Chen, J. Lei, X. Huang, Y. Tian, S. Lin, L. Wang

SPIE - The International Society of Optical Engineering

J.-C. Conchello, Q. Yu, J.W. Lichtman

Society of Photo-optical Instrumentation Engineers

J. Sytsma, J. Vroom, H.C. Gerritsen, Y.K. Levine

Society of Photo-optical Instrumentation Engineers

Zerbe,J., Cotze,C.H., Zuschratter,W.

SPIE - The International Society for Optical Engineering

H. Ma, J. Jiang, H. Ren, A. E. Cable

Society of Photo-optical Instrumentation Engineers

Anderson, J. R., Barrett, S. F., Wilcox, M. J.

SPIE - The International Society of Optical Engineering

Garside,J.R., Somekh,M.G., See,C.W.

SPIE-The International Society for Optical Engineering

Fu, S., Chia, T.C., Kwek, L.C., Diong, C.H., Tang, C.L., Choen, F.S., Krishnan, S.M.

SPIE-The International Society for Optical Engineering

Dixon,A.E., Damaskinos,S., Ribes,A.

SPIE-The International Society for Optical Engineering

S. Jung, C. Kim, S. Ju, Y. Cho, H. Jeong, B. Kim

SPIE - The International Society of Optical Engineering

T.G. Barton, M. Christ, H.-J. Foth, K. Hörmann, N. Stasche

Society of Photo-optical Instrumentation Engineers

C.-H. Chang, C. Chou, H.-F. Chang, H.-F. Yau, H.-J. Huang, W.-C. Kuo

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12