Artifact reduction in mutual-information-based CT-MR image registration

Artifact reduction in mutual-information-based CT-MR image registration

著者名:

Wei, M. ( Ohio Univ. (USA) )
Liu, J. ( Ohio Univ. (USA) ) , ( Nokia Inc. (USA) )

掲載資料名:

Medical Imaging 2004: Image Processing

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5370

発行年:

2004

開始ページ:

1176

終了ページ:

1186

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819452832 [0819452831]

言語:

英語

請求記号:

P63600/5370.2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013716
シリーズID:	PA00000029
会議名:	Medical imaging
回次:	2004
会議開催地:	San Diego, CA, USA
会議開催年:	2004.02.16-2004.02.19

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