Optical and thermomechanical properties of plasma-enhanced CVD silicon dioxide films upon annealing
- 著者名:
- Choi, D.Y. ( Samsung Advanced Institute of Technology (South Korea) )
- You, K.H. ( Samsung Advanced Institute of Technology (South Korea) )
- Guessel, S. ( Samsung Advanced Institute of Technology (South Korea) )
- Jung, S.T. ( Samsung Electronics Co., Ltd. (South Korea) )
- 掲載資料名:
- Integrated Optics: Devices, Materials, and Technologies VIII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5355
- 発行年:
- 2004
- 開始ページ:
- 40
- 終了ページ:
- 51
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452634 [0819452637]
- 言語:
- 英語
- 請求記号:
- P63600/5355
- 資料種別:
- 国際会議録
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THE ELECTRICAL AND OPTICAL PROPERTIES OF AMORPHOUS SILICON ALLOYS BY PLASMA-ENHANCED CVD METHOD
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Study of Precursors for Atmospheric Pressure Plasma Enhanced CVD (AP-PECVD) of Silicon Dioxide Films
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