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The reliability of RF-MEMS: failure modes, test procedures, and instrumentation

著者名:
De Wolf, I. ( IMEC (Belgium) )  
掲載資料名:
Reliability, Testing, and Characterization of MEMS/MOEMS III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5343
発行年:
2004
開始ページ:
1
終了ページ:
8
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452511 [0819452513]
言語:
英語
請求記号:
P63600/5343
資料種別:
国際会議録

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