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Compact TCSPC upgrade package for laser scanning microscopes based on 375- to 470-nm picosecond diode lasers

著者名:
掲載資料名:
Optical Diagnostics and Sensing IV
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5325
発行年:
2004
開始ページ:
179
終了ページ:
186
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452337 [0819452335]
言語:
英語
請求記号:
P63600/5325
資料種別:
国際会議録

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