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Factor analysis for comparing NIR reflection and transmittance for noninvasive glucose measurement

著者名:
  • Jeon, K.J. ( Samsung Advanced Institute of Technology (South Korea) )
  • Hahn, S. ( Samsung Advanced Institute of Technology (South Korea) )
  • Hwang, I.D. ( Samsung Advanced Institute of Technology (South Korea) )
  • Yoon, G. ( Seoul National Univ. of Technology (South Korea) )
掲載資料名:
Advanced biomedical and clinical diagnostic systems II : 25-26 January 2004, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5318
発行年:
2004
開始ページ:
113
終了ページ:
120
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452269 [0819452262]
言語:
英語
請求記号:
P63600/5318
資料種別:
国際会議録

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