Factor analysis for comparing NIR reflection and transmittance for noninvasive glucose measurement
- 著者名:
- Jeon, K.J. ( Samsung Advanced Institute of Technology (South Korea) )
- Hahn, S. ( Samsung Advanced Institute of Technology (South Korea) )
- Hwang, I.D. ( Samsung Advanced Institute of Technology (South Korea) )
- Yoon, G. ( Seoul National Univ. of Technology (South Korea) )
- 掲載資料名:
- Advanced biomedical and clinical diagnostic systems II : 25-26 January 2004, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5318
- 発行年:
- 2004
- 開始ページ:
- 113
- 終了ページ:
- 120
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819452269 [0819452262]
- 言語:
- 英語
- 請求記号:
- P63600/5318
- 資料種別:
- 国際会議録
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11
国際会議録
Study on the noninvasive blood glucose measurement by diffusion reflectance NIR spectroscopy
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