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Quantification of skin wrinkles using low coherence interferometry

著者名:
Oh, J.-T. ( Yonsei Univ. (South Korea) )
Kim, B.-M. ( Yonsei Univ. (South Korea) )
Son, S.-R. ( Yonsei Univ. (South Korea) )
Lee, S.-W. ( Yonsei Univ. (South Korea) )
Kim, D.-Y. ( Yonsei Univ. (South Korea) )
Kim, Y.-S. ( Chonnam National Univ. (South Korea) )
さらに 1 件
掲載資料名:
Coherence domain optical methods and optical coherence tomography in biomedicine VIII : 26-28 January 2004, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5316
発行年:
2004
開始ページ:
463
終了ページ:
466
総ページ数:
4
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452245 [0819452246]
言語:
英語
請求記号:
P63600/5316
資料種別:
国際会議録

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