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A calibration method using only one plane for 3D machine vision

著者名:
  • Deng, S. ( Hefei Univ. of Technology (China) )
  • Yang, Y. ( Hefei Univ. of Technology (China) )
  • Wang, X. ( Hefei Univ. of Technology (China) )
掲載資料名:
Machine Vision Applications in Industrial Inspection XII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5303
発行年:
2004
開始ページ:
52
終了ページ:
63
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452061 [0819452068]
言語:
英語
請求記号:
P63600/5303
資料種別:
国際会議録

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