Point pattern relaxation matching with known number of spurious points

Point pattern relaxation matching with known number of spurious points

著者名:: Jun, S. ( Chongqing Univ. (China) )
掲載資料名:: Third International Symposium on Multispectral Image Processing and Pattern Recognition
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 5286
発行年:: 2003
開始ページ:: 326
終了ページ:: 329
総ページ数:: 4
出版情報:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819451811 [0819451819]
言語:: 英語
請求記号:: P63600/5286.1
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00013630
シリーズID:	PA00000029
会議名:	International Symposium on Multispectral Image Processing and Pattern Recognition
回次:	2003 : 3rd
会議開催地:	Beijing, China
会議開催年:	2003.10.20-2003.10.22

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