Blank Cover Image

Optical monitoring for transparent and all-optical networks

著者名:
Giles, R.C. ( Lucent Technologies/Bell Labs. (USA) )  
掲載資料名:
Network Architectures, Management, and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5282
発行年:
2004
開始ページ:
275
終了ページ:
281
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451774 [0819451770]
言語:
英語
請求記号:
P63600/5282.1
資料種別:
国際会議録

類似資料:

N. Yoshikane, T. Tsuritani, J. H. Lee, T. Otani

Society of Photo-optical Instrumentation Engineers

Zhao,X., Zhao,Y., Wang,L.M., Chai,Y., Choa,F.-S.

SPIE-The International Society for Optical Engineering

Leuthold, J.

SPIE - The International Society of Optical Engineering

Ji, H.C., Park, K.J., Kim, J.K., Chung, Y.C.

SPIE-The International Society for Optical Engineering

Yoder,R.C., Salasky,M.

SPIE-The International Society for Optical Engineering

Barger,C., Collings,N.

SPIE-The International Society for Optical Engineering

Husbands,C.R., Devine,J.F.

SPIE-The International Society for Optical Engineering

Giles, I. P., Mondanos, M.

SPIE - The International Society of Optical Engineering

Arkut,I.C., Arkut,R.C., Ghani,N.

SPIE-The International Society for Optical Engineering

Malloy, K.J., Giles, C.L.

Materials Research Society

Marquis,D., Castagnozzi,D.M., Hemenway,B.R., Parikh,S.A., Stevens,M.L., Swanson,E.A., Thomas,R.E., Ozveren,C., …

SPIE-The International Society for Optical Engineering

Kypraios, I.I., Young, R.C., Chatwin, C.R.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12