Test of 1.06-μm photo detector of PIN photodiode
- 著者名:
- Fu, R. ( Nanjing Univ. of Science and Technology (China) )
- Chang, B. ( Nanjing Univ. of Science and Technology (China) )
- Qian, Y. ( Nanjing Univ. of Science and Technology (China) )
- Zong, Z. ( Nanjing Univ. of Science and Technology (China) )
- Qiu, Y. ( Nanjing Univ. of Science and Technology (China) )
- 掲載資料名:
- Materials, Active Devices, and Optical Amplifiers
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5280
- 発行年:
- 2004
- 開始ページ:
- 566
- 終了ページ:
- 573
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451750 [0819451754]
- 言語:
- 英語
- 請求記号:
- P63600/5280.2
- 資料種別:
- 国際会議録
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