Angled stripe InGaAsP/InP SLED fabricated by low-damage inductively coupled plasma dry etching
- 著者名:
Zhang, J. ( Accelink Technologies Co., Ltd. (China) ) Huang, X.-D. ( Accelink Technologies Co., Ltd. (China) ) Chang, J. ( Accelink Technologies Co., Ltd. (China) ) Liu, Y.-J. ( Accelink Technologies Co., Ltd. (China) ) Gan, Y. ( Accelink Technologies Co., Ltd. (China) ) Li, L.S. ( Accelink Technologies Co., Ltd. (China) ) Wang, D.-L. ( Accelink Technologies Co., Ltd. (China) ) Liu, T. ( Accelink Technologies Co., Ltd. (China) ) Jiang, S. ( Accelink Technologies Co., Ltd. (China) ) Deng, L. ( Oxford Instruments Plc (United Kingdom) ) - 掲載資料名:
- Materials, Active Devices, and Optical Amplifiers
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5280
- 発行年:
- 2004
- 開始ページ:
- 473
- 終了ページ:
- 476
- 総ページ数:
- 4
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451750 [0819451754]
- 言語:
- 英語
- 請求記号:
- P63600/5280.2
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
SPIE - The International Society for Optical Engineering |
9
国際会議録
AIGaN Schottky Characteristics After Hybrid Photoenhanced Wet and Inductively Coupled Plasma Etching
Electrochemical Society |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
国際会議録
Parametric Study of Compound Semiconductor Etching Utilizing Inductively Coupled Plasma Source
MRS - Materials Research Society |