Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy (NSOM)

Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy (NSOM)

著者名:

Wang, H. ( South China Normal Univ. (China) )

Liao, C. ( South China Normal Univ. (China) )

Fan, G. ( South China Normal Univ. (China) )

Liu, S.-H. ( South China Normal Univ. (China) )

Wu, Y. ( Jinan Univ. (China) )

Wang, B. ( Jinan Univ. (China) )

Zeng, G. ( Jinan Univ. (China) )

Cai, J. ( Jinan Univ. (China) )

さらに 3 件

掲載資料名:

Photonics: Design, Technology, and Packaging

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5277

発行年:

2004

開始ページ:

383

終了ページ:

396

総ページ数:

14

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451705 [0819451703]

言語:

英語

請求記号:

P63600/5277

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013619
シリーズID:	PA00000029
会議名:	Smart Materials, Nano-, and Micro- Smart Systems : Photonics
回次:	2003
会議開催地:	Perth, Australia
会議開催年:	2003.12.10-2003.12.12

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