Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy (NSOM)
- 著者名:
Wang, H. ( South China Normal Univ. (China) ) Liao, C. ( South China Normal Univ. (China) ) Fan, G. ( South China Normal Univ. (China) ) Liu, S.-H. ( South China Normal Univ. (China) ) Wu, Y. ( Jinan Univ. (China) ) Wang, B. ( Jinan Univ. (China) ) Zeng, G. ( Jinan Univ. (China) ) Cai, J. ( Jinan Univ. (China) ) - 掲載資料名:
- Photonics: Design, Technology, and Packaging
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5277
- 発行年:
- 2004
- 開始ページ:
- 383
- 終了ページ:
- 396
- 総ページ数:
- 14
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451705 [0819451703]
- 言語:
- 英語
- 請求記号:
- P63600/5277
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
12
国際会議録
Influence of the low-temperature buffer layer on InP epitaxial growth on GaAs substrates [6020-118]
SPIE - The International Society of Optical Engineering |