Characterization of thin metal oxide films grown by atomic layer deposition
- 著者名:
Evans, P.J. ( Australian Nuclear Science and Technology Organisation (Australia) ) Prince, K. ( Australian Nuclear Science and Technology Organisation (Australia) ) Triani, G. ( Australian Nuclear Science and Technology Organisation (Australia) ) Finnie, K.S. ( Australian Nuclear Science and Technology Organisation (Australia) ) Mitchell, D.R.G. ( Australian Nuclear Science and Technology Organisation (Australia) ) Barbe, C.J. ( Australian Nuclear Science and Technology Organisation (Australia) ) - 掲載資料名:
- Device and process technologies for MEMS, microelectronics, and photonics III : 10-12 December 2003, Perth, Australia
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5276
- 発行年:
- 2004
- 開始ページ:
- 184
- 終了ページ:
- 190
- 総ページ数:
- 7
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451699 [081945169X]
- 言語:
- 英語
- 請求記号:
- P63600/5276
- 資料種別:
- 国際会議録
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5
国際会議録
CHARACTERIZATION OF ZnS LAYERS GROWN BY MOCVD FOR THIN FILM ELECTROLUMINESCENCE (TFEL) DEVICES
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