Image denoising using fractal- and wavelet-based methods

Image denoising using fractal- and wavelet-based methods

著者名:

Barthel, K.U. ( Fachhochschule fuer Technik und Wirtschaft Berlin (Germany) )
Cycon, H.L. ( Fachhochschule fuer Technik und Wirtschaft Berlin (Germany) )
Marpe, D. ( Heinrich-Hertz-Institut fuer Nachrichtentechnik (Germany) )

掲載資料名:

Wavelet Applications in Industrial Processing

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5266

発行年:

2004

開始ページ:

39

終了ページ:

47

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451545 [0819451541]

言語:

英語

請求記号:

P63600/5266

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013610
シリーズID:	PA00000029
会議名:	Photonics East : Wavelet Applications in Industrial Processing
回次:	2003
会議開催地:	Providence, RI, USA
会議開催年:	2003.10.28-2003.10.29

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