Aberration analysis and adjustment of nonspherical lens in the linear CCDs three-dimensional measurement system

Aberration analysis and adjustment of nonspherical lens in the linear CCDs three-dimensional measurement system

著者名:

Wu, J. ( Tsinghua Univ. (China) )
Ding, H. ( Tsinghua Univ. (China) )
Wang, G. ( Tsinghua Univ. (China) )

掲載資料名:

Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5252

発行年:

2004

開始ページ:

478

終了ページ:

486

総ページ数:

9

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451361 [0819451363]

言語:

英語

請求記号:

P63600/5252

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013597
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Optical fabrication, testing, and metrology
回次:	2003
会議開催地:	St. Etienne, France
会議開催年:	2003.09.30-2003.10.03

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