Measuring the local radii of the curvature of an aspheric surface using two interferometric methods

Measuring the local radii of the curvature of an aspheric surface using two interferometric methods

著者名:

Granados-Agustin, F.S. ( Instituto Nacional de Astrofisica Optica y Electronica (Mexico) )
Escobar-Romero, F. ( Instituto Nacional de Astrofisica Optica y Electronica (Mexico) )
Sacramento-Solano, J.D. ( Instituto Nacional de Astrofisica Optica y Electronica (Mexico) )
Cornejo-Rodriguez, A. ( Instituto Nacional de Astrofisica Optica y Electronica (Mexico) )

掲載資料名:

Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5252

発行年:

2004

開始ページ:

272

終了ページ:

281

総ページ数:

10

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819451361 [0819451363]

言語:

英語

請求記号:

P63600/5252

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013597
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Optical fabrication, testing, and metrology
回次:	2003
会議開催地:	St. Etienne, France
会議開催年:	2003.09.30-2003.10.03

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