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Optical second-harmonic spectroscopy of silicon nanocrystals and step-edges

著者名:
Downer, M.C. ( Univ. of Texas/Austin (USA) )
Figliozzi, P.C. ( Univ. of Texas/Austin (USA) )
Jiang, Y. ( Univ. of Texas/Austin (USA) )
Sun, L. ( Univ. of Texas/Austin (USA) )
Mattern, B. ( Univ. of Texas/Austin (USA) )
White, C.W. ( Oak Ridge National Lab. (USA) )
Withrow, S.P. ( Oak Ridge National Lab. (USA) )
さらに 2 件
掲載資料名:
Physical Chemistry of Interfaces and Nanomaterials II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5223
発行年:
2003
開始ページ:
1
終了ページ:
8
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450968 [0819450960]
言語:
英語
請求記号:
P63600/5223
資料種別:
国際会議録

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