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Positional accuracy as a measure of Chandra's optical distortions

著者名:
Beckerman, E. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Aldcroft, T. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Gaetz, T.J. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Jerius, D.H. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Nguyen, D. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
Tibbetts, M. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )
さらに 1 件
掲載資料名:
X-ray, and gamma-ray instrumentation for astronomy XIII : 3-5 August 2003 San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5165
発行年:
2004
開始ページ:
445
終了ページ:
456
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450388 [0819450383]
言語:
英語
請求記号:
P63600/5165
資料種別:
国際会議録

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