Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor

Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor

著者名:

Neal, D.R. ( WaveFront Sciences, Inc. (USA) )

Pulaski, P. ( WaveFront Sciences, Inc. (USA) )

Raymond, T.D. ( WaveFront Sciences, Inc. (USA) )

Neal, D.A. ( WaveFront Sciences, Inc. (USA) )

Wang, Q. ( National Institute of Standards and Technology (USA) )

Griesmann, U. ( National Institute of Standards and Technology (USA) )

さらに 1 件

掲載資料名:

Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5162

発行年:

2003

開始ページ:

129

終了ページ:

138

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450357 [0819450359]

言語:

英語

請求記号:

P63600/5162

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013541
シリーズID:	PA00000029
会議名:	Optics & Photonics : Advanced Wavefront Control
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.06-2003.08.07

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