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Optical correction for multiple back reflections in an automated spectroradiometric measurement system

著者名:
  • Garland, W.C. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Biggar, S.F. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Zalewski, E.F. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
  • Thome, K.J. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
掲載資料名:
Imaging spectrometry IX : 6-7 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5159
発行年:
2003
開始ページ:
82
終了ページ:
90
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450326 [0819450324]
言語:
英語
請求記号:
P63600/5159
資料種別:
国際会議録

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