Spectral element method: application to structural damage identification

Spectral element method: application to structural damage identification

著者名:

Lee, U. ( Inha Univ. (South Korea) )
Yoo, H.-S. ( Inha Univ. (South Korea) )

掲載資料名:

Smart Materials, Structures, and Systems

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5062

発行年:

2003

開始ページ:

712

終了ページ:

719

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819448682 [0819448680]

言語:

英語

請求記号:

P63600/5062.2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013527
シリーズID:	PA00000029
会議名:	Smart materials, structures, and systems
回次:	2002
会議開催地:	Bangalore, India
会議開催年:	2002.12.12-2002.12.14

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