Noise Behaviour in SiGe BiCMOS Technology

Noise Behaviour in SiGe BiCMOS Technology

著者名:

Regis, M ( LAASCNRS France )

Plana, R. ( LAASCNRS France )

Borgarino, M ( LAASCNRS France )

Tartarin, J.G. ( LAASCNRS France )

Llopis, O. ( LAASCNRS France )

Lafontaine, H. ( SiGe Microsystems mc, Canada )

Kovacic, S. ( SiGe Microsystems mc, Canada )

さらに 2 件

掲載資料名:

Proceedings, European Space Components Conference, ESCCON 2000, 21-23 March 2000, ESTEC, Noordwijk, the Netherlands

シリーズ名:

ESA SP

シリーズ巻号:

439

発行年:

2000

開始ページ:

313

終了ページ:

318

総ページ数:

6

出版情報:

Noordwijk, The Netherlands: ESA Publications Division

ISSN:

03796566

ISBN:

9789290927563 [9290927569]

言語:

英語

請求記号:

E11690/439

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013447
シリーズID:	PA00000009
会議名:	European Space Components Conference : ESCCON 2000
回次:	2000
会議開催地:	Noordwijk, The Netherlands
会議開催年:	2000.03.21-2000.03.23

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